Xrf Spectrometer
| Applications | For Research |
| Type | Xrf |
| Configuration | Benchtop |
MicrOptik’s XRF M4L is intended for laboratory research on a wide range of objects. The analyzer is equipped with a spacious measurement chamber that is covered by an actuator. The measurement table’s entire surface is accessible, enabling the placement of samples of any size. The analyzer is outfitted with a thermal printer and a helium purge channel system. An automatic sampler is available as an alternative.Technical Characteristics of the Analyzer Expert 4LThe duration of continuous operation is not restricted.
Duration of autonomous power supply A minimum of six hoursAC, 50/60 Hz, 100-240 V is the power supply.Unit of power consumption measurement Less than 30 watts
Dimensions of the measuring chamber 397 x 225 x 153 mmThe maximum weight of the sample that was measured From 1 mg to 20 kg
Guarantee A minimum of one yearinput:
output:OPERATING CONDITIONSOperating temperature range: -10°C to +45°CRelative humidity within the operating temperature range is less than 90%.
MAECENAS IACULIS
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ADIPISCING CONVALLIS BULUM
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