Optical Microscope

The Cold Field Emission source is an optimal choice for high-resolution imaging due to its compact size and energy distribution. The ultimate FE-SEM is made possible by the innovative CFE Gun technology, which provides superior beam brightness and stability, enabling high-resolution imaging and high-quality elemental analysis.input:
output:The SU9000II provides new capabilities that enable automated adjustments of the optical system, as well as the new EM Flow Creator software package, as an option for automated data acquisition, particularly sequential data collection, in order to facilitate stable data acquisition at the instrument’s highest performance levels.
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output:Furthermore, the optical system’s distinctive design enables the use of EELS for sophisticated material analysis.input:
output:Summary

HITACHI’s most recent premium SEM is the SU9000II. The sample is situated within a gap between the upper and lower portions of the objective lens pole piece, which is characterized by its distinctive electron optics. Combining the next generation of HITACHI’s cold field emission technology with the so-called true in-lens concept, the system is guaranteed to achieve the highest possible resolution (SE resolution 0.4 nm @ 30 kV, 0.7 nm @1.0 kV [with deceleration feature option]) and stability.input:
output:A novel coherent cold field emission source input:
output:In order to make this resolving power practical for use in your laboratory, the SU9000II employs an ultra-stable side-entry sample stage that is reminiscent of high-end TEM systems. Additionally, it incorporates optimized vibration damping and a closed cabinet to protect the electron optics from environmental noise. Additionally, the SU9000II’s clean vacuum concept provides a vacuum level in the gun and sample chamber that is one order of magnitude superior to that of the previous generation.