Afm Spectrometer

The most advanced spectroscopy, imaging, and property mapping capabilities available to academic researchers and industrial users are provided by Bruker’s large-sample Dimension IconIR™ system, which combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on a single platform. Based on and expanding upon the Dimension Icon®’s industry-leading AFM measurement capabilities, IconIR offers unparalleled performance, integrating decades of technological innovation and research. The system enables correlative microscopy and chemical imaging with improved resolution and monolayer sensitivity, while its distinctive large-sample architecture offers the greatest degree of sample flexibility for a wide variety of applications. input:
output:EffectiveGuided workflow and programmable stageinput:
output:
Offers the highest measurement throughput with an AFM-IR that is intrinsically user-friendly.MultimodalChemical and property mappinginput:
output:Provides quantitative data on nanochemical, nanomechanical, and nanoelectrical phenomena.input:
output:Sub-5 nanometersinput:
output:patented photothermal AFM-IR imaginginput:
output:Facilitates the most accurate signal-to-noise characterization and the highest resolution with monolayer sensitivity.The Initial and Exclusive nanoIR Capabilities and Performanceinput:
output:IconIR offers the most advanced performance in a single system for monolayer sensitivity, chemical imaging resolution, and nanoscale infrared spectroscopy.Only Dimension IconIR provides the following:input:
output:High-performance nanoIR spectroscopy with monolayer sensitivity, <5 nm chemical resolution, and accurate and repeatable FTIR correlationinput:
output:PeakForce Tapping® nanomechanical and nanoelectrical modes for comparative chemical imaginginput:
output:AFM imaging of the highest performance and unparalleled sample flexibility with large-sample accommodation*